2017 IEEE 23rd International Symposium on on Line Testing and Robust System Design (IOLTS)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Summary | Annotation On line testing and more generally design for robustness, are important in modern electronic systems These needs increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins process, voltage and temperature variations aging and wear out soft error and EMI sensitivity and power density and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs Design for reliability is also mandatory for reducing power dissipation, as reducing voltage for reducing power strongly affects reliability by reducing noise margins and thus the sensitivity to soft errors and EMI, and by increasing circuit delays which increase sensitivity to timing faults Design for Security is also strongly related with Design for Reliability, as security attacks are often fault based IOLTS is an established forum for presenting novel ideas and experimental data on these areas |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781538603536 |
| ISBN | 1538603535 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |