2015 International Workshop on CMOS Variability (VARI)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Summary | Annotation VARI 2015 is the 6th International Workshop on CMOS Variability The increasing variability in CMOS transistor characteristics, as well as its sensitivity to environmental variations has become a major challenge to scaling and integration Strong links must be established between circuit design, system design and device technology The VARI workshop answers to the need to have an event on variability in CMOS technology development and circuit design, where industry and academia meet VARI objective is to provide a forum to discuss and investigate the CMOS process and environmental variability issues in methodologies and tools for the design of current and upcoming generations of integrated circuits and systems The technical program will focus on performance and power consumption as well as architectural aspects like adaptability or resilience, with emphasis on modeling a design, characterization, analysis and optimization in respect to variability |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781509000722 |
| ISBN | 1509000720 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |