Software Metrics Symposium (Metrics '98), 5th International

Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos : IEEE Computer Society Press
Description200 p.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects

Summary Annotation Partial Contents: Architectural Metrics; Program Understanding; Program Analysis; Software Process Improvement; Error Models & Measures; Object-Oriented Measures; Program Management Measures; Formal Models; Testing Measures
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9780818692017
ISBN0818692014 (Trade Paper) Active Record
Standard identifier# 9780818692017
Stock number00029433

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available