Proceedings / International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, Calif., USA ; sponsored by IEEE Computer Society, Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuit[s] Society ; edited by D. Lepejian ... [et al.].
| Author/creator | IEEE International Workshop on Memory Technology, Design and Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | ix, 131 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Other author/creator | Lepejian, D. (David) |
| Other author/creator | IEEE Computer Society. |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | IEEE Computer Society. Technical Committee on VLSI. |
| Other author/creator | IEEE Solid-State Circuits Society. |
| Other author/creator | IEEE Xplore (Online service) |
| Cover title | Records of the IEEE International Workshop on Memory Technology, Design and Testing |
| General note | "IEEE Computer Society Order Number PR08494"--T.p. verso. |
| General note | "IEEE Order Plan Catalog Number 98TB100236"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 00501671 |
| ISBN | 0818684941 |
| ISBN | 0818684968 (microfiche) |
| ISSN | 1087-4852 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |