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IEEE International Workshop on IDDQ Testing digest of papers, November 5-6, 1997, Washington, D.C. / edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
| Author/creator | IEEE International Workshop on IDDQ Testing |
| Other author | Jayasumana, Anura P. |
| Other author | IEEE Computer Society. Technical Test Technology Committee. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | ix, 119 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Subjects |
| Portion of title | IDDQ testing |
| General note | "IEEE Computer Society order number PR08123"--T.p. verso. |
| General note | "IEEE order plan catalog number 97TB100169"--T.p. verso. |
| Bibliography note | Includes bibliographic references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 97072789 |
| ISBN | 0818681233 (softbound) |
| ISBN | 081868125X (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |