Defect and Fault-Tolerance in VLSI Systems, 1997 International Symposium
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 350 p. 23.000 x 015.000 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Subjects |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780818681684 |
| ISBN | 0818681683 (Trade Paper) Active Record |
| Standard identifier# | 9780818681684 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |