Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 304 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 10636722 |
| ISBN | 9780818663079 |
| ISBN | 0818663073 (Trade Cloth) Out of Stock Indefinitely |
| Standard identifier# | 9780818663079 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |