The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
| Author/creator | International Test Conference 1990 : Washington, D.C.) |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | IEEE Computer Society. Philadelphia Chapter. |
| Other author/creator | IEEE Xplore (Online service) |
| Format | Electronic and Book |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | xvi, 1083 p. : ill. ; 29 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subject(s) |
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| General note | "IEEE catalog number 90CH2910-6"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 90055486 |
| ISBN | 081869064X |
Available Items
| Library | Location | Call Number | Status | Item Actions | |
| Electronic Resources | View Online Content | ✔ Available |