2015 IEEE 24th North Atlantic Test Workshop (NATW)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Summary | Annotation The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs In addition to traditional topics, the 24th NATW will feature a general theme of Synthesis and Reliability Topics are not limited to, the following Analog, Mixed Signal & RF Testing Built In Self Test (BIST) Board Level Testing Delay & Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA & Embedded Core Testing IDDQ Testing DFM, Defect Analysis & Defect Based Testing Memory & MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test & DebugTest Quality System Reliability |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781467374187 |
| ISBN | 1467374180 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |