2015 IEEE 24th Asian Test Symposium (ATS)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation ATS is recognized as the main event in Asia that covers the many dimensions of testing and fault tolerance The symposium focuses on the key test challenge will arise due to the ability to design complex systems such as robots that encompass sensors, communication systems, processors, transducers and enabling software In addition to passing post manufacture test procedures, such systems and relevant devices must exhibit fault tolerance and survivability characteristics |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781467397407 |
| ISBN | 1467397407 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |