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010 a| 2016462098;

020 a| 9781479908608 (pbk.);

020 a| 1479908606 (pbk.);

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111 2 a| International Test Conferencen| (44th :d| 2013 :c| Anaheim, Calif.)?| UNAUTHORIZED;

245 10 a| 2013 IEEE International Test Conference (ITC 2013)h| [electronic resource] :b| Anaheim, California, USA, 6-13 September 2013.;

246 3 a| ITC 2013;

260 a| Piscataway, NJ :b| IEEE,c| [2013];

300 a| xi, 497 pages :b| illustrations ;c| 27 cm;

500 a| "IEEE catalog number: CFP13ITC-POD.";

504 a| Includes bibliographical references.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Telecommunicationv| Congresses.=| ^A461011;

650 0 a| Radio frequencyv| Congresses.=| ^A1418809;

655 0 a| Electronic books.=| ^A491897;

710 2 a| Institute of Electrical and Electronics Engineers.=| ^A9546;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6646057;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6646057;

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2013 IEEE International Test Conference (ITC 2013) Anaheim, California, USA, 6-13 September 2013.

Author/creator	International Test Conference
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, NJ : IEEE, [2013]
Description	xi, 497 pages : illustrations ; 27 cm
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Integrated circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Telecommunication--Congresses. Radio frequency--Congresses.

Variant title	ITC 2013
General note	"IEEE catalog number: CFP13ITC-POD."
Bibliography note	Includes bibliographical references.
Bibliography note	Includes bibliographical references.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2016462098
ISBN	9781479908608 (pbk.)
ISBN	1479908606 (pbk.)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

2013 IEEE International Test Conference (ITC 2013) Anaheim, California, USA, 6-13 September 2013.

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