1998 IEEE International Workshop on IDDQ Testing proceedings : November 12-13, 1998, San Jose, California / edited by Yashwant K. Malaiya and Sankaran M. Menon ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
| Author/creator | IEEE International Workshop on IDDQ Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, California : IEEE Computer Society Press, |
| Description | ix, 82 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Other author/creator | Malaiya, Yashwant K. |
| Other author/creator | Menon, Sankaran M. |
| Other author/creator | IEEE Computer Society. Technical Test Technology Committee. |
| Other author/creator | IEEE Xplore (Online service) |
| Parallel title | IDDQ testing |
| General note | "IEEE Computer Society Order Number PR09191"--verso of T.p. |
| General note | "IEEE Order Plan Catalog Number 98EX232"--verso of T.p. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 98087881 |
| ISBN | 0818691913 |
| ISBN | 081869193X (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |