Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California / [edited by Tom Wik, Adit Singh, and Rochit Rajsuman] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.

Author/creator IEEE International Workshop on Memory Technology, Design and Testing
Format Electronic
Publication InfoLos Alamitos, Calif. : IEEE Computer Society,
Descriptionix, 95 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Semiconductor storage devices--Testing. --Congresses.
Random access memory--Congresses.

Other author/creatorWit, Tom.
Other author/creatorSingh, Adit.
Other author/creatorRajsuman, Rochit.
Other author/creatorIEEE Computer Society.
Other author/creatorIEEE Computer Society. Technical Committee on VLSI.
Other author/creatorIEEE Computer Society. Technical Council on Test Technology.
Other author/creatorIEEE Solid-State Circuits Society.
Other author/creatorIEEE Xplore (Online service)
Variant title MTDT 2003
General note"IEEE Computer Society Order Number PR02004"--T.p. verso.
General note" ... the eleventh annual IEEE International Workshop ..."--P. vii.
Bibliography noteIncludes bibliographical references and author index.
Access restrictionAvailable only to authorized users.
Other formsAlso available via the World Wide Web.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2004272254
ISBN0769520049

Availability

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Electronic Resources Access Content Online ✔ Available