Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
| Author/creator | IEEE International Workshop on Memory Technology, Design and Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | xii, 182 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Other author/creator | Courtois, B. (Bernard) |
| Other author/creator | Wik, T. (Thomas) |
| Other author/creator | Zorian, Yervant. |
| Other author/creator | IEEE Computer Society. |
| Other author/creator | IEEE Computer Society. Technical Committee on VLSI. |
| Other author/creator | IEEE Computer Society. Technical Council on Test Technology. |
| Other author/creator | IEEE Solid-State Circuits Society. |
| Other author/creator | IEEE Xplore (Online service) |
| Cover title | Memory technology, design and testing |
| General note | "IEEE Computer Society Order Number PR01617"--T.p. verso. |
| General note | "... 10th anniversary of the Workshop ..."--P. x. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2002512007 |
| ISBN | 0769516173 |
| ISBN | 0769516181 (bookbroker) |
| ISBN | 076951619X (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |