Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore] / edited by Philip Ho ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
| Author/creator | International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Format | Electronic |
| Publication Info | Piscataway, New Jersey. : IEEE, |
| Description | [ix], [220] p. : ill. ; 29 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Other author/creator | Ho, Philip. |
| Other author/creator | IEEE Reliability/CPMT/ED Singapore Chapter. |
| Other author/creator | IEEE Electron Devices Society. |
| Other author/creator | IEEE Reliability Society. |
| Other author/creator | National University of Singapore. Centre for IC Failure Analysis and Reliability. |
| Other author/creator | IEEE Xplore (Online service) |
| Portion of title | IPFA 2003 |
| Portion of title | Physical & failure analysis of integrated circuits |
| General note | "IEEE Catalog Number 03TH8662"--T.p. verso. |
| General note | Issues for 18th (2011)- cataloged as a serial in LC. |
| Bibliography note | Includes bibliographic references and author index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2002115581 |
| ISBN | 0780377222 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |