Proceedings International Test Conference 2003 [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
| Author/creator | International Test Conference |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | Institute of Electrical and Electronics Engineers. Philadelphia Section. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, |
| Description | xvi, 1334 p. : ill. ; 29 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | ITC International Test Conference 2003 |
| General note | At head of title: ITC International Test Conference 2003 |
| General note | Conference number inferred. |
| General note | "IEEE Catalog Number 03CH37494"--T.p. verso. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2004298641 |
| ISBN | 0780381068 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |