Proceedings 1997 GaAs Reliability Workshop : October 12, 1997, Anaheim, California / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc.

Author/creator GaAs Reliability Workshop
Other author JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.
Other author IEEE Electron Devices Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication Info[Arlington, VA : IEEE,
Descriptionv, 116 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Subjects
Gallium arsenide semiconductors--Reliability. --Congresses.
Bipolar transistors--Reliability. --Congresses.
Accelerated life testing--Congresses.

General note"IEEE catalog number: 97TH8340"--Cover p. [2].
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 98193590
ISBN0790800640 (softbound ed.)
ISBN0780343131 (microfiche ed.)

Availability

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Electronic Resources ✔ Available