On wafer characterization 63rd ARFTG Conference digest : Spring, 2004 : 11 June, 2004, Fort Worth, TX / Automatic RF Techniques Group.
| Author/creator | ARFTG Conference |
| Other author | Automatic RF Techniques Group. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, NJ : IEEE, |
| Description | x, 227 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | 63rd ARFTG conference digest |
| General note | Cover title. |
| General note | "IEEE Catalog Number: 04EX811"--T.p. verso. |
| Bibliography note | Includes bibliographical references. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2004101280 |
| ISBN | 0780383710 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |