On-Line Testing Workshop (IOLTW 2002) 8th IEEE International Workshop
| Author/creator | IEEE Computer Society Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | I E E E [Imprint] Los Alamitos : IEEE Computer Society Press |
| Description | 288 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation Papers from a July 2002 conference are presented in sections on hardware fault tolerance, hardware-software design and validation of fault tolerant systems, self-checking circuits, concurrent error detection, reliability issues for very deep sub-micron ICs, and analog and mixed signal testing and reliability. Other themes include fault injection techniques and results, BIST techniques, testing issues, memory BIST analysis and application, memory ECC and soft errors, high reliability in railway and automotive systems, and embedded memory yield enhancement. Specific topics include a high- speed encoder for recursive systematic convolutive codes, on-line monitor design of finite-state machines, bit flip injection in processor-based architectures, and stop and go BIST. This work lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769516417 |
| ISBN | 0769516416 (Trade Paper) Active Record |
| Standard identifier# | 9780769516417 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |