On-Line Testing Workshop (IOLTW 2000) 6th IEEE International

Author/creator IEEE Computer Society Staff
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos : IEEE Computer Society Press
Description150 p. ill 11.000 x 08.500 in.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects

Summary Annotation Presents 36 contributions from the July 2000 workshop addressing electronic engineering concerns in the testing of electronics systems for the prevention of field failures. Eleven sessions addressed topics such as fault tolerance and on-line testing for reconfigurable systems, reliability issues in nanometer technologies and radiation effects, fault injection, on-line current modeling, concurrent checking, built-in self testing, defect driven testing, self checking circuits and analog approaches, coding theory and applications, and fault tolerance and on-line testing in railway and industrial control. Annotation copyrighted by Book News, Inc., Portland, OR
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 00103667
ISBN9780769506463
ISBN0769506461 (Trade Paper) Active Record
Standard identifier# 9780769506463
Stock numberPR0646 00029433

Availability

Library Location Call Number Status Item Actions
Electronic Resources ✔ Available