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Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003 / IEEE Components, Packaging, and Manufacturing Technology Society.
| Author/creator | IEEE Semiconductor Thermal Measurement and Management Symposium |
| Other author | IEEE Components, Hybrids, and Manufacturing Technology Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : IEEE, |
| Description | xiii, 404 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Portion of title | Semiconductor Thermal Measurement and Management Symposium |
| Portion of title | SEMI-THERM proceedings 2003 |
| General note | Cover title. |
| General note | "IEEE Catalog Number 02CH37437 Softbound Edition ; 02CD37437C CD-ROM Edition"--verso of T.p. verso. |
| Bibliography note | Includes bibliographical references. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web with additional title: Semiconductor Thermal Measurement and Management Symposium, 2003, Ninteenth Annual IEEE. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| Other title | Semiconductor Thermal Measurement and Management Symposium, 2003, Ninteenth Annual IEEE. |
| LCCN | 2004296095 |
| ISBN | 0780377931 (softbound ed.) |
| ISBN | 078037794X (CD-ROM ed.) |
| Stock number | IEEE Xplore POP |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |