Proceedings 2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California / editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
| Author/creator | IEEE International Workshop on Memory Technology, Design, and Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | viii, 108 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Zorian, Yervant. |
| Other author/creator | IEEE Computer Society. |
| Other author/creator | IEEE Computer Society. Technical Committee on VLSI. |
| Other author/creator | IEEE Computer Society. Technical Council on Test Technology. |
| Other author/creator | IEEE Solid-State Circuits Society. |
| Other author/creator | IEEE Xplore (Online service) |
| Spine title | Records of the IEEE International Workshop on Memory Technology, Design, and Testing 2000 |
| General note | "IEEE Computer Society Order Number PR01242"--T.p. verso. |
| General note | "... the ninth in a series of annual workshops ..."--P. vii. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2001277459 |
| ISBN | 0769512429 |
| ISBN | 0769512437 (case) |
| ISBN | 0769512445 (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |