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020 a| 0780385802 (pbk.);

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040 a| LHLc| LHLd| DLCd| WaSeSS;

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111 2 a| International Test Conferencen| (35th :d| 2004 :c| Charlotte, N.C.)?| UNAUTHORIZED;

245 10 a| International Test Conference 2004h| [electronic resource] :b| proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA /c| sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.;

246 30 a| ITC International Test Conference 2004;

260 a| Washington, D.C. :b| International Test Conference ;a| Piscataway, N.J. :b| IEEE,;

300 a| xvi, 1459 p. :b| ill. ;c| 28 cm.;

500 a| Cover title.;

500 a| "Conference 35 Years"--cover.;

500 a| "IEEE Catalog Number 04CH37586"--T.p. verso.;

504 a| Includes bibliographical references and author index.;

506 a| Available only to authorized users.;

530 a| Also available via the World Wide Web.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Telecommunicationv| Congresses.=| ^A461011;

650 0 a| Radio frequencyv| Congresses.=| ^A1418809;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| Institute of Electrical and Electronics Engineers.b| Philadelphia Section.=| ^A724775;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9526;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9526;

947 a| (OCoLC)ocm56941586;

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949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4673014-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 3/21/2017x| EBOOKz| JERESOURCE;

International Test Conference 2004 proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.

Author/creator	International Test Conference
Other author	IEEE Computer Society. Test Technology Technical Committee.
Other author	Institute of Electrical and Electronics Engineers. Philadelphia Section.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE,
Description	xvi, 1459 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Integrated circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Telecommunication--Congresses. Radio frequency--Congresses.

Portion of title	ITC International Test Conference 2004
General note	Cover title.
General note	"Conference 35 Years"--cover.
General note	"IEEE Catalog Number 04CH37586"--T.p. verso.
Bibliography note	Includes bibliographical references and author index.
Access restriction	Available only to authorized users.
Other forms	Also available via the World Wide Web.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2005295298
ISBN	0780385802 (pbk.)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

International Test Conference 2004 proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.

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