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Discover the new world of test and design International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
| Author/creator | International Test Conference |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | Institute of Electrical and Electronics Engineers. Philadelphia Section. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Altoona, PA : The Conference ; Piscataway, NJ : Can be ordered from IEEE Service Center, |
| Description | xii, 1012 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Subjects |
| General note | Cover title. |
| General note | "IEEE catalog number 92-CH3191-4"--P. ii. |
| General note | "IEEE Computer Society Press order number 3167"--P. ii. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 92073585 |
| ISBN | 0780307607 (casebound) |
| ISBN | 0818631678 (softbound) |
| ISBN | 081863166X (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |