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111 2 a| IEEE International Workshop on Defect Based Testingd| (2004 :c| Napa, Calif.)?| UNAUTHORIZED;

245 10 a| DBT 2004h| [electronic resource] :b| 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA /c| edited by Sankaran Menon ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Committee.;

246 3 a| VDSM chips and the need for defect based test;

246 30 a| Current & defect based testing;

260 a| Piscataway, N.J. :b| IEEE,;

300 a| ix, 112, [1] p. :b| ill. ;c| 27 cm.;

500 a| 2000 workshop as: IEEE International Workshop on Defect Based Testing.;

500 a| " ... held in conjunctionwith the VLSI Test Symposium (VTS2004), in Napa, CA. The theme of this year's workshop "VDSM Chips and the Need for Defect Based Test ..."--P. v.;

500 a| "IEEE Catalog Number 04EX1004"--Cover.;

504 a| Includes bibliographical references and author index.;

506 a| Available only to authorized users.;

530 a| Also issued online with additional title: Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.;

538 a| Mode of access: World Wide Web;

650 0 a| Metal oxide semiconductors, Complementaryv| Congresses.=| ^A198738;

650 0 a| Integrated circuitsx| Defectsv| Congresses.=| ^A42814;

650 0 a| Iddq testingv| Congresses.?| UNAUTHORIZED;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Menon, Sankaran M.?| UNAUTHORIZED;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

711 2 a| IEEE VLSI Test Symposiumd| (2004 :c| Napa, Calif.)?| UNAUTHORIZED;

740 0 a| Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9666;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9666;

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DBT 2004 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA / edited by Sankaran Menon ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Committee.

Author/creator	IEEE International Workshop on Defect Based Testing
Format	Electronic
Publication Info	Piscataway, N.J. : IEEE,
Description	ix, 112, [1] p. : ill. ; 27 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Metal oxide semiconductors, Complementary--Congresses. Integrated circuits--Defects. --Congresses. Iddq testing--Congresses.

Other author/creator	Menon, Sankaran M.
Other author/creator	IEEE Computer Society. Test Technology Technical Committee.
Other author/creator	IEEE Xplore (Online service)
Other author/creator	IEEE VLSI Test Symposium (2004 : Napa, Calif.)
Variant title	VDSM chips and the need for defect based test
Portion of title	Current & defect based testing
General note	2000 workshop as: IEEE International Workshop on Defect Based Testing.
General note	" ... held in conjunctionwith the VLSI Test Symposium (VTS2004), in Napa, CA. The theme of this year's workshop "VDSM Chips and the Need for Defect Based Test ..."--P. v.
General note	"IEEE Catalog Number 04EX1004"--Cover.
Bibliography note	Includes bibliographical references and author index.
Access restriction	Available only to authorized users.
Other forms	Also issued online with additional title: Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
Other title	Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.
LCCN	2005278015
ISBN	0780389506

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings	✔ Available

DBT 2004 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA / edited by Sankaran Menon ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Committee.

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