Asian Test Symposium 12th

Author/creator IEEE Computer Society Staff
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos : IEEE Computer Society Press Piscataway : IEEE [Distributor]
Description538 p. 11.000 x 08.500 in.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects

Summary Annotation The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9780769519517
ISBN0769519512 (Trade Paper) Active Record
Stock numberPR1951 00029433

Availability

Library Location Call Number Status Item Actions
Electronic Resources ✔ Available