2005 ROCS Workshop proceedings : October 30, 2005, Palm Springs, California / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
| Author/creator | ROCS Workshop |
| Other author | JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards. |
| Other author | IEEE Electron Devices Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Arlington, Va. : JEDEC ; Piscataway, N.J. : IEEE, |
| Description | viii, 181 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Variant title | GaAs REL Workshop |
| Portion of title | ROCS Workshop |
| Spine title | Reliability of compound semiconductors |
| General note | "IEEE Catalog Number: 05TH8858"--T.p. verso. |
| General note | "ROCS Workshop (formerly the GaAs REL Workshop)"--cover. |
| Bibliography note | Includes bibliographic references. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2006282608 2004280994 |
| ISBN | 079080106X |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |