2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
| Author/creator | International Integrated Reliability Workshop (2003 : Lake Tahoe, California) |
| Other author/creator | IEEE Electron Devices Society. |
| Other author/creator | IEEE Reliability Society. |
| Other author/creator | IEEE Xplore (Online service) |
| Format | Electronic and Book |
| Edition | Softbound ed. |
| Publication Info | Piscataway, New Jersey : IEEE Society, |
| Description | viii, 182 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subject(s) |
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| General note | "IEEE Catalog Number: 03TH8715"--T.p. verso. |
| General note | ISBN from label on t.p. verso of copy 1. |
| Bibliography note | Includes bibliographic references. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2003110309 |
| ISBN | 0780381572 |
Available Items
| Library | Location | Call Number | Status | Item Actions | |
| Electronic Resources | View Online Content | ✔ Available |