Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002 / edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPM/ED Singapore Chapter; technically co-sponored by IEEE Electron Devices Society, IEEE Reliability Society in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
| Author/creator | International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Other author | Thong, John T. L. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, NJ : IEEE, |
| Description | 258 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| General note | "8-12 July 2002, Raffles City Convention Centre, Singapore"--Cover. |
| General note | "IEEE catalog no. 02TH8614"--Cover. |
| General note | Issues for 18th (2011)- cataloged as a serial in LC. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2002100970 |
| ISBN | 0780374169 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |