2000 IEEE International Workshop on Defect Based Testing April 30, 2000, Montreal, Canada : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.
| Author/creator | IEEE International Workshop on Defect Based Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | ix, 82 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Malaiya, Yashwant K. |
| Other author/creator | Sachdev, Manoj. |
| Other author/creator | Menon, Sankaran M. |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | IEEE Xplore (Online service) |
| Other author/creator | IEEE VLSI Test Symposium (2000 : Montréal, Québec) |
| Cover title | Digest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000 |
| General note | "IEEE Catalog Number PR00637"--Cover p. [4]. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 00102862 |
| ISBN | 0769506372 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |