2000 GaAs Reliability Workshop proceedings : November 5, 2000, Seattle, Washington / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.

Author/creator GaAs Reliability Workshop
Other author JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.
Other author IEEE Electron Devices Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway, N.J. : IEEE,
Descriptionvii, 224 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Gallium arsenide semiconductors--Congresses.
Semiconductors--Reliability. --Congresses.
Semiconductors--Materials. --Congresses.

General note"IEEE Catalog Number: 00TH8513"--T.p. verso.
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Other formsAlso available via the World Wide Web with additional title: GaAs Reliability Workshop, 2000, proceedings.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2002276471
ISBN0790801027 (softbound)
ISBN0780350677 (microfiche)

Availability

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Electronic Resources ✔ Available