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010 a| 96079035;

020 a| 0780337379 (softbound);

020 a| 0780337387 (microfiche);

035 a| (WaSeSS)ssj0000455100;

042 a| lccopycat;

049 a| EREEa| NEHH;

050 04 a| TK7871.85b| .I5844 1997;

111 2 a| International Workshop on Statistical Metrologyn| (2nd :d| 1997 :c| Kyoto, Japan)?| UNAUTHORIZED;

245 10 a| 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyotoh| [electronic resource] /c| sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.].;

260 a| [New York] :b| Institute of Electrical and Electronics Engineers,;

300 a| vi, 124 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE cat. no. 97TH8246.";

504 a| Includes bibliographical references.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Semiconductorsx| Measurementx| Congresses.=| ^A16124;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D4978;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D4978;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D4978;

947 a| (OCoLC)38037384;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4665748;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4665748-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 3/19/2017x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4665748-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 3/19/2017x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4665748-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 3/19/2017x| EBOOKz| JERESOURCE;

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto / sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.].

Author/creator	International Workshop on Statistical Metrology
Other author	IEEE Electron Devices Society.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	[New York] : Institute of Electrical and Electronics Engineers,
Description	vi, 124 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Semiconductors--Characterization. --Statistical methods. --Congresses. Semiconductors--Measurement. --Congresses.

General note	"IEEE cat. no. 97TH8246."
Bibliography note	Includes bibliographical references.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	96079035
ISBN	0780337379 (softbound)
ISBN	0780337387 (microfiche)

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Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Access Content Online	✔ Available

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto / sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.].

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