18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems proceedings : 3-5 November, 2003, Boston, Massachusetts / edited by [C. Bolchini] ... [et al.] ; sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC).
| Author/creator | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | xii, 607 p. : ill. ; 23 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Bolchini, C. |
| Other author/creator | IEEE Computer Society. Fault-Tolerant Computing Technical Committee. |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | IEEE Xplore (Online service) |
| Portion of title | International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Portion of title | Defect and fault tolerance in VLSI systems |
| Variant title | Half t.p. title: DFT 2003 |
| General note | "IEEE Computer Society Order Number PR02042"--T.p. verso. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2003111750 |
| ISBN | 0769520421 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |