Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide / Y. Harada, N. Kurata, G. Furuno.
| Author/creator | Harada, Y. |
| Other author | Kurata, N. |
| Other author | Furuno, G. |
| Other author | United States. National Aeronautics and Space Administration. |
| Format | Book |
| Publication Info | Washington, DC : National Aeronautics and Space Administration ; [Springfield, Va.] : [National Technical Information Service, distributor], [1988] |
| Description | 1 volume. |
| Subjects |
| Series | NASA technical translation ; NASA TT-20332 NASA technical translation 20332. ^A30355 |
| Local note | Joyner-FOR JOYNER LIBRARY HOLDINGS OF THE SERIES, NASA TECHNICAL TRANSLATION, SEARCH BY CALL NUMBER TL507 .U745. |
| General note | Distributed to depository libraries in microfiche. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche. |
| GPO item number | 0830-H-21 (MF) |
| Govt. docs number | NAS 1.77:20332 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.77:20332 | ✔ Available |