Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system / Victor A. Carreno, G. Choi and R.K. Iyer.
| Author/creator | Carreno, Victor A. |
| Other author | Choi, G. |
| Other author | Iyer, R. K. |
| Other author | United States. National Aeronautics and Space Administration. Scientific and Technical Information Division. |
| Format | Book |
| Publication Info | [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va.] : [National Technical Information Service, distributor], 1990. |
| Description | 1 volume. |
| Variant title | Analog digital simulation of transient induced logic errors and upset susceptibility of an advanced control system |
| Series | NASA technical memorandum ; 4241 NASA technical memorandum 4241. ^A467613 |
| General note | Distributed to depository libraries in microfiche. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1991] 1 microfiche. |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:4241 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:4241 | ✔ Available |