Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass / Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze.
| Author/creator | Juhasz, Albert J. |
| Other author | Tew, Roy C. |
| Other author | Schwarze, Gene E. |
| Other author | Lewis Research Center. |
| Format | Microform |
| Publication Info | [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, VA : National Technical Information Service, distributor, [1998] |
| Description | 1 volume. |
| Series | NASA technical memorandum ; NASA/TM-1998-208826 NASA technical memorandum 208826. ^A467613 |
| General note | Shipping list no.: 99-0559-M. |
| General note | CRDP Program record. |
| Reproduction note | Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1999]. 1 microfiche. |
| Issued in other form | Print version: Juhasz, Albert J. Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass |
| Issued in other form | Online version: Juhasz, Albert J. Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:208826 |
| Stock number | 19990018836 NASA |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:208826 | ✔ Available |