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LEADER 02132cam a2200481Ii 4500

001 ocm41240881;

003 OCoLC;

005 20171102093858.0;

007 he bmu024bbua;

008 990423s1998 ohua b f000 0 eng d;

035 a| (Sirsi) o41240881;

037 a| 19980219329b| NASA;

049 a| ERE$;

050 4 a| TP245.X4b| G75 1998;

074 a| 0830-D (MF);

086 0 a| NAS 1.15:208409;

100 1 a| Grisnik, Stanley P.,e| author.=| ^A426910;

245 10 a| Measurement of xenon viscosity as a function of low temperature and pressure /c| Stanley P. Grisnik.;

264 1 a| [Cleveland, Ohio] :b| National Aeronautics and Space Administration, Lewis Research Center,c| [1998];

264 2 a| Springfield, VA :b| National Technical Information Service, [distributor];

300 a| 10 pages :b| illustrations.;

336 a| textb| txt2| rdacontent;

337 a| microformb| h2| rdamedia;

338 a| microficheb| he2| rdacarrier;

490 1 a| NASA technical memorandum ;v| NASA/TM-1998-208409;

500 a| Shipping list no.: 99-0265-M.;

500 a| "Dec 3 1998"--Microfiche header.;

500 a| CRDP Program record.;

650 7 a| Density measurement.2| nasat;

650 7 a| Gas viscosity.2| nasat;

650 7 a| Xenon.2| nasat;

650 7 a| Pressure effects.2| nasat;

650 7 a| Capillary flow.2| nasat;

710 2 a| Lewis Research Center.=| ^A367825;

776 08 i| Print version:t| Measurement Of Xenon Viscosity As A Function Of Low Temperature And Pressurew| (OCoLC)213889690;

776 08 i| Online version:a| Grisnik, Stanley P.t| Measurement of xenon viscosity as a function of low temperature and pressurew| (OCoLC)995172650;

830 0 a| NASA technical memorandumv| 208409.=| ^A467613;

949 a| NAS 1.15:208409w| sudoch| joyner32;

596 a| 1;

998 a| 4474206;

999 a| NAS 1.15:208409w| SUDOCc| 1i| 4474206-1001l| JDOMIm| JOYNERr| Ys| Yt| JDOFMIu| 7/18/2016x| MICROFORMz| JFEDDOCSo| .STAFF. jjlm;

Measurement of xenon viscosity as a function of low temperature and pressure / Stanley P. Grisnik.

Author/creator	Grisnik, Stanley P. author.
Other author	Lewis Research Center.
Format	Microform
Publication	[Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center, [1998]
Distribution	Springfield, VA : National Technical Information Service, [distributor]
Description	10 pages : illustrations.

Series	NASA technical memorandum ; NASA/TM-1998-208409 NASA technical memorandum 208409. ^A467613
General note	Shipping list no.: 99-0265-M.
General note	"Dec 3 1998"--Microfiche header.
General note	CRDP Program record.
Reproduction note	Microfiche. [Washington, D.C.] : [National Aeronautics and Space Administration], [1998]. 1 microfiche : negative ; 4 x 6 in.
Issued in other form	Print version: Measurement Of Xenon Viscosity As A Function Of Low Temperature And Pressure
Issued in other form	Online version: Grisnik, Stanley P. Measurement of xenon viscosity as a function of low temperature and pressure
GPO item number	0830-D (MF)
Govt. docs number	NAS 1.15:208409
Stock number	19980219329 NASA

Library	Location	Call Number	Status	Item Actions
Joyner	Microforms B300	NAS 1.15:208409	✔ Available

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