Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425�C / Liang-Yu Chen, Gary W. Hunter, and Philip G. Neudeck, Dak Knight ; prepared for the 1997 Fall Meeting sponsored by the Materials Research Society, Boston, Massachusetts, December 1-5, 1997.

Author/creator Chen, Liang Yu author.
Other author Lewis Research Center.
Format Microform
Publication[Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center, [1998]
DistributionSpringfield, VA : National Technical Information Service, [Distributor]
Description6 pages, 4 unnumbered pages : illustrations.

SeriesNASA technical memorandum ; NASA/TM-1998-107429
NASA technical memorandum 107429. ^A467613
General noteMay 1998.
General noteShipping list no.: 99-0384-M.
General note"Aug 6 1998"--Microfiche header.
General noteCRDP Program record.
Reproduction noteMicrofiche. [Washington, D.C.] : [National Aeronautics and Space Administration], 1998. 1 microfiche : negative ; 4 x 6 in.
Issued in other formPrint version: Surface and interface study of pdcr/sic schottky diode gas sensor annealed at 425 c
Issued in other formOnline version: Chen, Liang Yu. Surface and interface study of PdCr/SiC Schottky diode gas sensor annealed at 425 �C
GPO item number0830-D (MF)
Govt. docs number NAS 1.15:107429
Stock number19980174929 NASA

Availability

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Joyner Microforms B300 NAS 1.15:107429 ✔ Available