Stochastic modeling of crack initiation and short-crack growth under creep and creep-fatigue conditions / Takayuki Kitamura, Louis J. Ghosn, and Ryuichi Ohtani.
| Author/creator | Kitamura, Takayuki |
| Other author | Ghosn, Louis J. |
| Other author | Ohtani, Ryuichi, 1938- |
| Other author | United States. National Aeronautics and Space Administration. |
| Format | Book |
| Publication Info | [Washington, D.C.] : NASA ; [Springfield, Va.] : [For sale by the National Technical Information Service], [1989] |
| Description | 1 volume. |
| Series | NASA technical memorandum ; 101358 NASA technical memorandum 101358. ^A467613 |
| General note | Distributed to depository libraries in microfiche. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1989] 1 microfiche. |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:101358 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:101358 | ✔ Available |