Noise temperature measurements on wafer / J. Randa.
| Author/creator | Randa, J. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997. |
| Description | iii, 57 pages : illustrations. |
| Subjects |
| Series | NIST technical note ; 1390 NIST technical note 1390. ^A420535 |
| General note | Shipping list no.: 98-0579-M. |
| General note | Paper version no longer available for sale by the Supt. of Docs. |
| General note | "March 1997." |
| Bibliography note | Includes bibliographical references (p. 33-36). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative. |
| GPO item number | 0249-A (MF) |
| Govt. docs number | C 13.46:1390 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.46:1390 | ✔ Available |