Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems / James E. Potzick.
| Author/creator | Potzick, James E. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O., 1997. |
| Description | xiii, 23 pages : illustrations ; 28 cm. |
| Subjects |
| Variant title | Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems |
| Series | Standard reference materials NIST special publication ; 260-129 NIST special publication 260-129. ^A390056 Standard reference materials. ^A420608 |
| General note | Distributed to depository libraries in microfiche. |
| General note | Shipping list no.: 98-0086-M. |
| Bibliography note | Includes bibliographical references (p. 17-18). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1997] 1 microfiche : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:260-129 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.10:260-129 | ✔ Available |