World class reliability using Multiple Environment Overstress Tests to make it happen / Keki R. Bhote and Adi K. Bhote.

Author/creator Bhote, Keki R., 1925-
Other author Bhote, Adi K.
Format Electronic
Publication InfoNew York : American Management Association,
Descriptionxix, 218 p. : ill. ; 24 cm.
Supplemental ContentFull text available from eBooks on EBSCOhost
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

Bibliography noteIncludes bibliographical references (p. 209-210) and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2003019970
ISBN0814407927

Availability

Library Location Call Number Status Item Actions
Electronic Resources ✔ Available