VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 proceedings, Sacramento, California, USA, October 30-November 1, 2007 / edited by William Ribarsky, John Dill.
| Author/creator | IEEE Symposium on Visual Analytics Science and Technology |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : IEEE, |
| Description | x, 246 p. : chiefly col. ill., col. maps ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Subjects |
| Other author/creator | Ribarsky, William. |
| Other author/creator | Dill, John, 1939- |
| Other author/creator | IEEE Computer Society. Technical Committee on Visualization and Graphics. |
| Other author/creator | IEEE Xplore (Online service) |
| General note | "Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee." |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2009417581 |
| ISBN | 9781424416592 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |