/LC.GIF&client=easterncarolinaedu)
System-on-chip test architectures nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
| Other author | Wang, Laung-Terng. |
| Other author | Stroud, Charles E. |
| Other author | Touba, Nur A. |
| Format | Electronic |
| Publication Info | Amsterdam ; Boston : Morgan Kaufmann Publishers, |
| Description | xxxvi, 856 p. : ill. ; 25 cm. |
| Supplemental Content | Full text available from eBook - Computer Science 2008 |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| Subjects |
| Series | The Morgan Kaufmann series in systems on silicon |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2007023373 |
| ISBN | 9780123739735 (hardcover : alk. paper) |
| ISBN | 012373973X (hardcover : alk. paper) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |