SIGMETRICS 2005 International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada / ACM-Sigmetrics.
| Author/creator | ACM-Sigmetrics |
| Other author | International Conference on Measurement and Modeling of Computer Systems. |
| Other author | ACM Digital Library. |
| Format | Electronic |
| Publication Info | [S.l.] : ACM, |
| Supplemental Content | Full text available from ACM Digital Library |
| General note | Title from content provider. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |