Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 5-9 July, 1999, Orchard Hotel, Singapore] / edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].

Author/creator International Symposium on the Physical & Failure Analysis of Integrated Circuits
Format Electronic
Publication InfoPiscataway, New Jersey : IEEE,
Description209 p. : ill. ; 30 cm.
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Subjects
Integrated circuits--Defects. --Congresses.
Integrated circuits--Testing. --Congresses.

Other author/creatorChim, Wai Kin.
Other author/creatorRadhakrishnan, M. K.
Other author/creatorThong, John T. L.
Other author/creatorIEEE Reliability/CPMT/ED Singapore Chapter.
Other author/creatorIEEE Xplore (Online service)
Parallel title Physical & failure analysis of integrated circuites
Parallel title 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Parallel title IPFA '99
General note"IPFA '99 proceedings"--Cover.
General note"IEEE Catalog Number 99TH8394"--verso of T.p.
General noteIssues for 18th (2011)- cataloged as a serial in LC.
Bibliography noteIncludes bibliographic references and author index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 98088539
ISBN0780351878 (siftbound)
ISBN0780351886 (microfiche)

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