Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 21-25 July, 1997, Raffles City Convention Centre, Singapore] / edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].

Author/creator International Symposium on the Physical & Failure Analysis of Integrated Circuits
Format Electronic
Publication InfoPiscataway, NJ : Institute of Electrical and Electronics Engineers,
Description[xi], 301, [5] p. : ill. ; 30 cm.
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Subjects
Integrated circuits--Defects. --Congresses.
Integrated circuits--Testing. --Congresses.

Other author/creatorRadhakrishnan, M. K.
Other author/creatorHo, Philip.
Other author/creatorChim, Wai Kin.
Other author/creatorIEEE Singapore Section. Reliability/CPMT/EDA Chapter.
Other author/creatorIEEE Xplore (Online service)
Cover title 6th International Symposium on the Physical & Failure Analysis of Integrated Circuites
Spine title 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Parallel title IPFA '97
General note"IPFA '97 proceedings"--Cover.
General note"IEEE catalog no. 97TH8289"--Cover.
General noteIssues for 18th (2011)- cataloged as a serial in LC.
Bibliography noteIncludes bibliographic references and author index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 97072002
ISBN0780339851 (softbound)

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