Tools

LEADER 03659cam a2200601 a 4500

001 ssj0000445277;

003 WaSeSS;

005 20240512155341.0;

006 m d ;

007 cr n ;

008 951120s1995 njua sb 101 0 eng d;

010 a| 95078165;

020 a| 0780327977 (pbk.);

020 a| 0780327985 (microfiche ed.);

035 a| (WaSeSS)ssj0000445277;

040 a| DLCc| DLCd| WaSeSS;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I47377 1995;

082 00 a| 621.38152| 20;

111 2 a| International Symposium on the Physical & Failure Analysis of Integrated Circuitsn| (5th :d| 1995 :c| Shangri-La Hotel, Singapore)?| UNAUTHORIZED;

245 10 a| Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuitsh| [electronic resource] /c| edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore.;

246 14 a| 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits;

260 a| Piscataway, NJ :b| Institute of Electrical and Electronics Engineers,;

300 a| 230 p. :b| ill. ;c| 30 cm.;

500 a| "IPFA '95 proceedings"--Cover.;

500 a| "IEEE catalog no. 95TH8113"--Cover.;

500 a| "27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover.;

500 a| Issues for 18th (2011)- cataloged as a serial in LC.5| DLC;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Defectsx| Congresses.=| ^A42814;

650 0 a| Integrated circuitsx| Testingx| Congresses.=| ^A450737;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Ong, Soon Huat.?| UNAUTHORIZED;

700 1 a| Radhakrishnan, M. K.?| UNAUTHORIZED;

710 2 a| IEEE Singapore Section.b| Reliability/CPMT/EDA Chapter.?| UNAUTHORIZED;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| National University of Singapore.b| Centre for IC Failure Analysis and Reliability.?| UNAUTHORIZED;

710 2 a| Institute of Microelectronics.?| UNAUTHORIZED;

710 2 a| Magnetics Technology Centre.?| UNAUTHORIZED;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3504;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3504;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3504;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4242681;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4242681-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 1/2/2016x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4242681-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 1/2/2016x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4242681-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 1/2/2016x| EBOOKz| JERESOURCE;

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits / edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore.

Author/creator	International Symposium on the Physical & Failure Analysis of Integrated Circuits
Format	Electronic
Publication Info	Piscataway, NJ : Institute of Electrical and Electronics Engineers,
Description	230 p. : ill. ; 30 cm.
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Integrated circuits--Defects. --Congresses. Integrated circuits--Testing. --Congresses.

Other author/creator	Ong, Soon Huat.
Other author/creator	Radhakrishnan, M. K.
Other author/creator	IEEE Singapore Section. Reliability/CPMT/EDA Chapter.
Other author/creator	IEEE Electron Devices Society.
Other author/creator	National University of Singapore. Centre for IC Failure Analysis and Reliability.
Other author/creator	Institute of Microelectronics.
Other author/creator	Magnetics Technology Centre.
Other author/creator	IEEE Xplore (Online service)
Cover title	5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
General note	"IPFA '95 proceedings"--Cover.
General note	"IEEE catalog no. 95TH8113"--Cover.
General note	"27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover.
General note	Issues for 18th (2011)- cataloged as a serial in LC.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	95078165
ISBN	0780327977 (pbk.)
ISBN	0780327985 (microfiche ed.)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Conference Proceedings Archive Full text available from IEEE Conference Proceedings Archive Full text available from IEEE Conference Proceedings Archive	✔ Available

Click here for more information about this title

Availability