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Proceedings, International Test Conference 1998
| Author/creator | International Test Conference |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Washington, DC : International Test Conference, |
| Description | xvi, 1179 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Cover title | 1998 IEEE International Test Conference |
| Portion of title | International Test Conference 1998 |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 99208103 |
| ISBN | 0780350928 (softbound) |
| ISBN | 0780350936 (casebound) |
| ISBN | 0780350944 (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |