NDCS 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts / sponsored by IEEE Computer Society, IEEE Test Technology Technical Council.
| Author/creator | IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems |
| Other author | IEEE Computer Society. |
| Other author | IEEE Computer Society. Technical Council on Test Technology. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | x, 85 p. : ill. .; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems |
| Portion of title | Design and Test of Nano Devices, Circuits and Systems |
| General note | "IEEE Computer Society Order Number P3379" --T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2008931359 |
| ISBN | 9780769533797 |
| ISBN | 0769533795 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |